Journal Report

ULTRAMICROSCOPY

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Journal Information
Journal Title
ULTRAMICROSCOPY
Publisher
ELSEVIER
ISSN
0304-3991
E-ISSN
1879-2723
Database
Clarivate
Domain
Life Sciences, Physical Sciences, Social Sciences
Classification History
Year A+ A B C
2026 ✓ ✓
2025 ✓ ✓
2024 ✓ ✓
2023 ✓ ✓
2021/2022 ✓ ✓
2020 ✓ ✓
2019 ✓ ✓
2018 ✓
A journal may have more than one classification in the same year. All recorded classifications are displayed.
Recent Articles
A differential algebra computational framework for high-order aberration analysis of electromagnetic lenses
Zhicheng Liu, Shikai Zhu, Xu Liu et al.
2027-1 Vol. 288 Pages 114451
DOI: 10.1016/j.ultramic.2026.114451
Pushing the dose limit of atomic-resolution imaging: A 4D-STEM case study of NaCl
Tamazouzt Chennit, Arno Annys, Songge Li et al.
2027-1 Vol. 288 Pages 114452
DOI: 10.1016/j.ultramic.2026.114452
Electrostatic multipolar probe-forming objective lens for FIB
Lucile Berdou-Durrieu, Jean-Baptiste Mellier, Jean-Baptiste Fay et al.
2027-1 Vol. 288 Pages 114460
DOI: 10.1016/j.ultramic.2026.114460
Study on nonlinear spatial stitching method of SICM images based on adaptive region candidates
Xiaobo Liao, Wenlin Wu, Zhiwu Wang et al.
2027-1 Vol. 288 Pages 114453
DOI: 10.1016/j.ultramic.2026.114453
Scan-coil delay causes anisotropic signal loss in fast 4D-STEM
Vishal Kumar, Andreas Jehle, Tizian Lorenzen et al.
2027-1 Vol. 288 Pages 114464
DOI: 10.1016/j.ultramic.2026.114464
Pushing the limits of energy resolution by combining monochromated EELS with the CEOS energy-filtering and imaging device in the JEOL atomic-resolution multi-dimensional TEM
Tobias Heil, Heiko Müller, Stephan Uhlemann et al.
2027-1 Vol. 288 Pages 114449
DOI: 10.1016/j.ultramic.2026.114449
Thickness determination from EDXS maps acquired in a transmission electron microscope and its application for shape reconstruction of nanoparticles
Radian Popescu, Dagmar Gerthsen, Simon Hettler et al.
2027-1 Vol. 288 Pages 114466
DOI: 10.1016/j.ultramic.2026.114466
Efficient large-scale STEM-EELS simulations with torched-TACAW
Martin Osmera, João Vaz, Paul M. Zeiger et al.
2027-1 Vol. 288 Pages 114461
DOI: 10.1016/j.ultramic.2026.114461
Controlling charge, energy spread, and pulse duration in an ultrafast scanning electron microscope
Tomáš Chlouba, Magdalena Solà-Garcia, Nika van Nielen et al.
2027-1 Vol. 288 Pages 114462
DOI: 10.1016/j.ultramic.2026.114462
A variational method based post-processing framework for high-fidelity EBSD grain-detection refinement
Xu Zhang, Haitao Zhao, Junheng Gao et al.
2026-11 Vol. 287 Pages 114443
DOI: 10.1016/j.ultramic.2026.114443
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Printed: November 7, 2026 17:35