Journal Report

JOURNAL OF EDUCATIONAL MEASUREMENT

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Journal Information
Journal Title
JOURNAL OF EDUCATIONAL MEASUREMENT
Publisher
WILEY
ISSN
0022-0655
E-ISSN
1745-3984
Database
Clarivate
Domain
Physical Sciences, Social Sciences
Classification History
Year A+ A B C
2026 ✓ ✓
2025 ✓ ✓
2024 ✓ ✓
2023 ✓ ✓
2021/2022 ✓ ✓
2020 ✓ ✓
2019 ✓ ✓
2018 ✓
A journal may have more than one classification in the same year. All recorded classifications are displayed.
Recent Articles
Diagnosing Block‐Position Effects on the Item Difficulty Scale: A Stage‐Specific Localized Difficulty‐Shift Model
Tien‐Yu Hsieh
2026-10-21 Vol. 63 Issue 4
DOI: 10.1111/jedm.70069
Issue Information
2026-10-15 Vol. 63 Issue 4
DOI: 10.1111/jedm.70068
Predicting and Evaluating Item Responses Using Machine Learning, Text‐Embeddings, and LLMs
Evelyn S. Johnson, Hsin‐Ro Wei, Onur Demirkaya et al.
2026-10-7 Vol. 63 Issue 4
DOI: 10.1111/jedm.70067
Structure‐Regularized Composite Scoring for Calibrated MIRT Item Banks
Tien‐Yu Hsieh
2026-10-4 Vol. 63 Issue 4
DOI: 10.1111/jedm.70066
Increasing the Efficiency of Comparative Judgment for Writing Assessment: Warm‐Starting Estimation and Selection Using NLP
Michiel De Vrindt, Renske Bouwer, Anaïs Tack et al.
2026-9-30 Vol. 63 Issue 4
DOI: 10.1111/jedm.70065
Automated Scoring of Long‐Context Essays Using Linear‐Complexity Language Models
Christopher Ormerod
2026-9 Vol. 63 Issue 3
DOI: 10.1111/jedm.70064
Population Difficulty and Discrimination in Item Response Theory: A Complement to Traditional Item Parameters
Joakim Wallmark
2026-9 Vol. 63 Issue 3
DOI: 10.1111/jedm.70061
Conditional Standard Errors, Posterior Standard Deviations, and Conditional Standard Errors of Prediction in IRT Scoring
Peter Baldwin
2026-9 Vol. 63 Issue 3
DOI: 10.1111/jedm.70059
Variable‐Length Calibration Stopping Rules for Multidimensional Computerized Adaptive Testing
Hengxin Pang, Yuanyuan Qi, Yinhong He et al.
2026-9 Vol. 63 Issue 3
DOI: 10.1111/jedm.70063
Residual‐Based DIF Detection as a Model‐Agnostic Framework: A Comparison of Parametric, Semi‐Parametric, and Nonparametric Methods
Shan Huang, David Goretzko
2026-8-31 Vol. 63 Issue 3
DOI: 10.1111/jedm.70062
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Printed: November 4, 2026 19:38