Journal Report

Surface Science Spectra

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Journal Information
Journal Title
Surface Science Spectra
Publisher
AVS Science and Technology Society
ISSN
1055-5269
E-ISSN
1520-8575
Database
SCOPUS
Domain
Physical Sciences, Social Sciences
Classification History
Year A+ A B C
2026 ✓
2025 ✓
2024 ✓
2023 ✓
2021/2022 ✓
2020 ✓
2019 ✓
2018
A journal may have more than one classification in the same year. All recorded classifications are displayed.
Recent Articles
XPS spectral analysis of graphitic carbon nitride-metal ferrite nanocomposites
Davide Barreca, Alberto Gasparotto, Gian Andrea Rizzi et al.
2026-9-30 Vol. 33 Issue 2
DOI: 10.1116/6.0005769
Time-of-flight secondary ion mass spectrometry reference spectra of cholesterol in positive and negative polarity
Ralf Zimmermann, Jens Friedrichs, Frederik Seidel et al.
2026-9-15 Vol. 33 Issue 2
DOI: 10.1116/6.0005689
Investigation of as-cast polymethylmethacrylate based homopolymer resists in positive ion mode with nano projectile secondary ion mass spectrometry
Markus Langner, Gregrey Swieca, Won-Il Lee et al.
2026-8-14 Vol. 33 Issue 2
DOI: 10.1116/6.0005527
Investigation of as-cast polymethylmethacrylate based homopolymer resists in negative ion mode with nano projectile secondary ion mass spectrometry
Markus Langner, Gregrey Swieca, Won-Il Lee et al.
2026-8-7 Vol. 33 Issue 2
DOI: 10.1116/6.0005526
XPS of Ru3(CO)12
Christopher R. Brewer, Amy V. Walker
2026-7-30 Vol. 33 Issue 2
DOI: 10.1116/6.0005512
XPS analysis of <i>in situ</i> exfoliated zirconium diselenide (ZrSe2) single crystal
Joslin S. Prasanna, Joy Roy, Rafik Addou
2026-7-28 Vol. 33 Issue 2
DOI: 10.1116/6.0005427
Nanoprojectile-secondary ion mass spectrometry negative spectra of common substrates: Gold and silicon
Pierre Hirchenhahn, Stanislav Verkhoturov, Emile A. Schweikert
2026-7-27 Vol. 33 Issue 2
DOI: 10.1116/6.0005438
HAXPES and XPS reference spectra of bulk semimetallic HgTe with Al <i>Kα</i> and Cr <i>Kα</i> monochromatic sources
Dario Mastrippolito, Charles Mansour, Paul Fougères et al.
2026-7-23 Vol. 33 Issue 2
DOI: 10.1116/6.0005588
Cholic acid spin-coated with acetone mass spectrum in NP-SIMS in negative mode
Pierre Hirchenhahn, Stanislav Verkhoturov, Emile A. Schweikert
2026-7-20 Vol. 33 Issue 2
DOI: 10.1116/6.0005372
Time-of-flight secondary ion mass spectrometry reference spectra of polymer coatings: Teflon™ AF 1601 in positive and negative polarity
Ralf Zimmermann, Mirko Nitschke
2026-6-1 Vol. 33 Issue 1
DOI: 10.1116/6.0005451
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Printed: November 6, 2026 00:05